Olympus has added to its line of handheld X-ray Fluorescence (XRF) analysers for fast light element detection with the new Vanta Element-S XRF instrument.
‘The new unit delivers fast light element detection at an affordable price, joining a family of cost-effective, entry-level Vanta Element XRF instruments’, the tech supplier says. The S model is equipped with a silicon drift detector to analyse light elements like magnesium, aluminum, silicon, sulphur as well as phosphorus in alloys.
‘Ideal for precious metals’, the Vanta Element-S effectively measures ferrous metals, aluminum, copper, stainless steel, nickel and gold carats. ‘The analyser offers clear on-screen grade ID and comparison for the light elements Mg, Al and Si in seconds,’ Olympus notes.
For greater uptime and reliability, the analysers are IP54 rated to resist dust and moisture and built to pass a 1.2 m drop test. Other protective features include a stainless-steel faceplate and a Prolene window with Kapton mesh support that sticks on and peels off for toolless window changes in the field.
‘Weighing 1.32 kg, the analyser is up to the challenge of all-day testing for alloy and metal analysis,’ Olympus says. Optional wireless connectivity, meanwhile, helps future-proof the new handheld.
The analysers are able to continuously perform in temperatures ranging from -10°C to +45°C.
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